TEST PROBES

Bead Probing is a methodology for placing test points directly on a PCB’s copper traces, or top metal, thus forming a “Bead Probe”.  These Bead Probes are then contacted by “Bead Target Probes” during in-circuit testing for expanded test access. Bead probe testing was developed by a major board test ATE supplier. ECT is supporting this technology with OEM’s, contract manufacturers, and test fixture partners. ECT has developed a series of spring probes, BTP and BPLT, specifically for Bead Probe applications featuring:

Pogo Plus Design ECT’s Pogo Plus design is an excellent choice for Bead Probe challenges.  The bias ball technology maintains excellent internal contact between the barrel and plunger even at the low forces required for bead probe applications.

Everett Charles Technologies General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.

Replaceable options are configured through the use of a mating receptacle permanently mounted into a retaining plate or retaining block via a “press-ring” or knurl. Typical probe retention is achieved by detents in the receptacle or additionally with a “Pylon” bend in the probe itself to prevent an anti walkout. General-purpose probes are used for typical automotive board test, burn-in test, and standard continuity test applications.

General-purpose non-replaceable probes are designed for industrial applications where typical probe life meets or exceeds those of the end-use product. They are typically located inside the end product where probe replacement is impossible or end product damage would occur. A non-replacement probe is designed to be permanently fixed in the retention plate and not removed without breaking the electrical connection of damaging the retention plate.

The rugged pylon line utilizes a full diameter bias ball the results in stable electrical performance at any compression. They are an ideal solution for any industrial test applications requiring the lowest resistance, high current and shock and vibration.

Everett Charles Technologies offers a comprehensive selection of pitch options, tip geometries, and platings to ensure an optimized probe solution for every application. ECT’s In-circuit and functional test product lines, which include LFRE and PogoPlus Series, address the unique demands of loaded board and vacuum fixture applications. Most probes feature an enhanced version of the legendary bias-ball design to virtually eliminate “false opens”; proprietary metal plating processes for higher conductivity; and precision MicroSharp steel tips for long-lasting durability. A full range of sizes accommodates products with mixed test center requirements.

ECT’s revolutionary PogoPlus with Biasing Ball technology probes eliminate probe-induced false opens, saving you the time, money, and trouble of needless product retesting. The unrivaled electrical performance of the PogoPlus is due to the interaction between the spring, captured ball, and plunger, which forces the plunger into continuous contact with the barrel wall at all times. The result is uninterrupted electrical continuity and low overall resistance that can’t be equaled by any other “high performance” probe.

The PogoPlus is also designed to be the world’s most durable probe with features like optional stainless-steel MicroSharp tips, a larger spring volume, and enhanced pointing precision.

LFRE plated probes from Everett Charles Technologies consistently outperform traditional Gold plated probes. LFRE plated probes provide customers with a proven high volume production test solution for lead free PCBA test applications. They ensure reliable contact and longer life for probes in in-circuit test fixtures. In addition to improved tip ware, LFRE plated probes are less prone to solder transfer.