M2 Wafers Test Station

Test Wafers to industry standards prior to dicing and packaging.

  • Testing up to 10kV.
  • Ideal for high power SiC and Si power devices, particularly 3.3kV wafers.
  • Interfaces to all wafer probers

Test DC, Gate resistance/capacitance, and perform avalanche all on one site.

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Productivity gains

  • Multiple probers from one test system

  • Lowest cost of test

  • Reduced floor space

  • Automated set-up with network capability

  • Off line Binning

Capability

  • Avalanche testing on wafer

  • Low RDS(ON) test capability

  • Dynamic switching at wafer level

  • Wafer map / yield analysis

ipTEST provides a range of serial test heads for all your wafer testing needs.

The test groups may be summarised as follows:

  • Static Parameter tests
  • Dynamic Switching tests
  • Linear Voltage Regulator tests
  • Transient Thermal tests
  • Avalanche Energy tests
  • Low RDS(ON) testing at wafer level